[PDF] testability free ebooks download




View results: Search for a phrase:
ISBN Language MD5 Extension

Library Search


17 books found also search"testability" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
252032 Payne J.E. Design-for-testability for object-oriented software 14 English 90 kb pdf GET
1288230 Hideo Fujiwara MIT Press series in computer systems
Logic testing and design for testability [2pr. ed.]
0-262-06096-5, 133-134-136-1, 139-140-144-1, 9780262060967
The MIT Press 1990 x, 284 pages : ill ; 24 cm English 3 Mb djvu GET
1191281 Hideo Fujiwara MIT Press series in computer systems
Logic testing and design for testability
0262060965, 9780262060967
MIT Press 1985 x, 284 p. : ill. ; 24 cm English 64 Mb pdf GET
349630 Frank F. Tsui Lsi/Vlsi Testability Design
0070653410, 9780070653412
Mcgraw-Hill (Tx) 1987 715 English 7 Mb djvu GET
341765 Catherine H. Gebotys, Mohamed I. Elmasry The Springer International Series in Engineering and Computer Science
Optimal VLSI Architectural Synthesis: Area, Performance and Testability [1 ed.]
079239223X, 9780792392231
Springer 1991 294 English 2 Mb djvu GET
958292 Catherine H. Gebotys, Mohamed I. Elmasry (auth.) The Kluwer International Series in Engineering and Computer Science 158
Optimal VLSI Architectural Synthesis: Area, Performance and Testability [1 ed.]
978-1-4613-6797-0, 978-1-4615-4018-2
Springer US 1992 289 English 9 Mb pdf GET
1071517 Joseph C. Pitt (auth.), Joseph C. Pitt (eds.) The University of Western Ontario Series in Philosophy of Science 16
Philosophy in Economics: Papers Deriving from and Related to a Workshop on Testability and Explanation in Economics held at Virginia Polytechnic Institute and State University, 1979 [1 ed.]
978-94-009-8396-0, 978-94-009-8394-6
Springer Netherlands 1981 212 English 14 Mb pdf GET
1492759 Bradley Irby Microsoft Windows Development Series
Reengineering .NET: Injecting Quality, Testability, and Architecture into Existing Systems [1 ed.]
0321821459, 9780321821454
Addison-Wesley Professional 2012 400 English 18 Mb epub GET
1035537 Laung-Terng Wang, Charles E. Stroud and Nur A. Touba (Eds.) System-on-Chip Test Architectures. Nanometer Design for Testability
978-0-12-373973-5
Morgan Kaufmann 2008 862 English 22 Mb pdf GET
227585 Laung-Terng Wang, Charles E. Stroud, Nur A. Touba Systems on Silicon
System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
012373973X, 9780123739735, 9780080556802
Morgan Kaufmann 2007 893 English 10 Mb pdf GET
941298 José L. Huertas (auth.), José L. Huertas (eds.) Test and Design-for-Testability in Mixed-Signal Integrated Circuits [1 ed.]
978-1-4419-5422-0, 978-0-387-23521-9
Springer US 2004 298 English 10 Mb pdf GET
959564 F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen (auth.) Frontiers in Electronic Testing 3
Testability Concepts for Digital ICs: The Macro Test Approach [1 ed.]
978-1-4613-6004-9, 978-1-4615-2365-9
Springer US 1995 212 English 9 Mb pdf GET
964284 Werner Schütz (auth.) The Springer International Series in Engineering and Computer Science 245
The Testability of Distributed Real-Time Systems [1 ed.]
978-0-7923-9386-3, 978-0-585-30261-4
Springer US 1993 144 English 2 Mb pdf GET
269116 Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Systems on Silicon
VLSI Test Principles and Architectures: Design for Testability [1 ed.]
9780123705976, 0123705975
Morgan Kaufmann 2006 809 English 6 Mb pdf GET
358340 Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Systems on Silicon
VLSI Test Principles and Architectures: Design for Testability [1 ed.]
0123705975, 9780123705976
Morgan Kaufmann 2006 798 English 23 Mb pdf GET
422801 Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) [1 ed.]
0123705975, 9780123705976, 9780080474793
2006 808 English 7 Mb pdf GET
584073 Erik Larsson Linköping Studies in Science and Technology
[Dissertation] An Integrated System-Level Design for Testability Methodology
9172198907, 9789172198906
Linköpings Universitet 2000 297 English 2 Mb pdf GET

 Бердинских И.П., Кузнецов М.А.
Фуско В.
Мартенс Л.К. (гл. ред.)
Биргер И.А., Пановко Я.Г. (ред.)
Alfred North Whitehead
Neal Koblitz (auth.)
Karsten Schmidt, Götz Trenkler
Гиндикин С.Г.
Робинсон А.
Желобенко Д.П.
Фукс Д.Б.
Ernest William Hobson
George A. Baker, P.R.Graves- Morris
John William Neuberger (auth.)
Бугров, Никольский.
Данко П., Попов А., Кожевникова Т.
Jean Francois Colombeau
E. C. Titchmarsh, D. R. Heath-Brown
Heath T.L.
Howard Iseri

thermal stresssoftware architectureplant virusesinsertion losstransmission linephase diagrambandwidthmonte carlocurrent densityuranium 238pesticidesbiomineralizationlaser induced fluorescenceisaacdisplaystrialfinite state automataanalysistotal internal reflection fluorescence