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17 books found also search"soft error" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
791833 Rajesh Garg, Sunil P. Khatri (auth.) Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations [1 ed.]
978-1-4419-0930-5, 978-1-4419-0931-2
Springer US 2010 212 English 4 Mb pdf GET
656529 Rajesh Garg, Sunil P. Khatri (auth.) Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations [1 ed.]
1441909303, 9781441909305
Springer US 2010 212 English 6 Mb pdf GET
205215 Shubu Mukherjee Architecture Design for Soft Errors
0123695295, 9780123695291, 9780080558325
Morgan Kaufmann 2008 361 English 5 Mb pdf GET
399479 Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.) Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances [1 ed.]
1441967141, 9781441967145, 9781441967152
Springer-Verlag New York 2011 204 English 13 Mb pdf GET
943482 Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.) Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances [1 ed.]
978-1-4419-6714-5, 978-1-4419-6715-2
Springer-Verlag New York 2011 204 English 13 Mb pdf GET
60562 Robert Laurence Baber Wiley Series in Software Engineering Practice
Error Free Software: Know-how and Know-why of Program Correctness
9780471930167, 0471930164
John Wiley & Sons Inc 1991 88 English 56 Mb pdf GET
630143 Robert Laurence Baber Error Free Software: Know-How and Know-Why of Program Correctness (Wiley Series in Software Engineering Practice)
0471930164, 9780471930167
John Wiley & Sons Inc 1991 88 English 56 Mb pdf GET
1467313 Fernanda Kastensmidt, Paolo Rech (eds.) FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design [1 ed.]
978-3-319-14351-4, 978-3-319-14352-1
Springer International Publishing 2016 VII, 325 English 12 Mb pdf GET
166803 Daniel M. Fleetwood, R. D. Schrimpf Selected topics in electronics and systems 34
Radiation effects and soft errors in integrated circuits and electronic devices
9812389407, 9789812389404
World Scientific Pub 2004 297 English 17 Mb pdf GET
1337004 Jean-Luc Autran; Daniela Munteanu Devices, circuits, and systems
Soft errors : from particles to circuits
9781466590847, 146659084X
CRC Press 2015 432 English 64 Mb pdf GET
417389 Tino Heijmen (auth.), Michael Nicolaidis (eds.) Frontiers in Electronic Testing 41
Soft Errors in Modern Electronic Systems [1 ed.]
1441969926, 9781441969927
Springer US 2011 318 English 6 Mb pdf GET
695800 Tino Heijmen (auth.), Michael Nicolaidis (eds.) Frontiers in Electronic Testing 41
Soft Errors in Modern Electronic Systems [1 ed.]
1441969926, 9781441969927
Springer US 2011 318 English 4 Mb pdf GET
1319802 Jean-Luc Autran, Daniela Munteanu Devices, Circuits, and Systems
Soft Errors: From Particles to Circuits [1 ed.]
1466590831, 9781466590830
CRC Press 2015 426 English 23 Mb pdf GET
1528613 J. C. Huang Software Error Detection through Testing and Analysis
978-0-470-40444-7
Wiley 2009 259 English 6 Mb pdf GET
219967 J. C. Huang Software Error Detection through Testing and Analysis
0470404442, 9780470404447
John Wiley & Sons 2009 271 English 1 Mb pdf GET
1034832 J. C. Huang Software Error Detection through Testing and Analysis [1 ed.]
0470404442, 9780470404447
Wiley 2009 259 English 6 Mb pdf GET
259952 Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, Mamoru Baba Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
9789812778819, 9812778810
World Scientific Publishing Company 2008 364 English 14 Mb pdf GET

 Evelyne Hubert (auth.), Franz Winkler, Ulrich Langer (eds.)
Samuel L. Braunstein
Блехман И.И. (ред.)
Barbara M. Birch
A. Grothendieck
James Victor Uspensky
Баренблатт Г.И.
Картан А.
Лаврентьев М.А., Шабат Б.В.
Victor A. Galaktionov
Barry Simon
Walter Gautschi (auth.), Francisco Marcellán, Walter Van Assche (eds.)
Вейль.
Andrea Braides (auth.)
Martini H., Swanepoel K.
Frank Morgan
Blaschke W.
Serge Lang
John M. Lee (auth.)
Гуревич В., Волмэн Г.

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