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7 books found also search"secondary ion mass spectrometry" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
996932 Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A. Loo(eds.) Cluster Secondary Ion Mass Spectrometry: Principles and Applications
9780470886052, 9781118589335
2013 357 English 10 Mb pdf GET
767265 Mostafa Fayek Secondary ion mass spectrometry in the earth sciences: gleaning the big picture from a small spot
0921294506, 9780921294504
Mineralogical Association of Canada 2009 177 English 31 Mb pdf GET
1135397 Nicholas Winograd (auth.), Prof. A. Benninghoven, Dr. C. A. Evans Jr., Dr. R. A. Powell, Prof. R. Shimizu, Dr. H. A. Storms (eds.) Springer Series in Chemical Physics 9
Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979 [1 ed.]
978-3-642-61873-4, 978-3-642-61871-0
Springer-Verlag Berlin Heidelberg 1979 300 English 20 Mb pdf GET
967496 F. G. Rüdenauer (auth.), Professor Dr. A. Benninghoven, Professor Dr. J. Giber, J. László, Dr. M. Riedel, Dr. H. W. Werner (eds.) Springer Series in Chemical Physics 19
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981 [1 ed.]
978-3-642-88154-1, 978-3-642-88152-7
Springer-Verlag Berlin Heidelberg 1982 447 English 11 Mb pdf GET
967553 P. Sigmund (auth.), Professor Dr. A. Benninghoven, Professor Dr. J. Okano, Professor Dr. R. Shimizu, Dr. H. W. Werner (eds.) Springer Series in Chemical Physics 36
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 [1 ed.]
978-3-642-82258-2, 978-3-642-82256-8
Springer-Verlag Berlin Heidelberg 1984 506 English 13 Mb pdf GET
967671 R. E. Honig (auth.), Professor Dr. Alfred Benninghoven, Dr. Richard J. Colton, Dr. David S. Simons, Dr. Helmut W. Werner (eds.) Springer Series in Chemical Physics 44
Secondary Ion Mass Spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 [1 ed.]
978-3-642-82726-6, 978-3-642-82724-2
Springer-Verlag Berlin Heidelberg 1986 564 English 15 Mb pdf GET
1203578 Paul van der Heide Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices [1 ed.]
1118480481, 9781118480489
Wiley 2014 384 English 4 Mb pdf GET

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 Кнунянц. (ред.)
Graham Hutton
Бакулин В.Н., Малков С.Ю., Гончаров В.В., Ковалев В.И.

Звелто О.

Niels Schwartz, James J. Madden
Цаленко М., Шульгейфер Е.
Sen Hu, E. Witten
Robert Vein, Paul Dale (auth.)
Эванс Л.К., Гариепи Р.Ф. (L.C.Evans,R.F.Gariepy)
Bruce Blackadar
Paolo Boggiatto, Luigi Rodino, Joachim Toft, M. W. Wong
Joseph Diestel
Балакришнан А.В. (Balakrishnan A.V.)
Гельфанд И.М., Граев М.И., Пятецкий-Шапиро И.И.
C. von Westenholz (Eds.)
Cameron P.J.
Jean-Luc Brylinski

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