[PDF] metrology free ebooks download




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113 books found   ►also search"metrology" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
1001271 Dr. Michael Quinten(auth.) A Practical Guide to Optical Metrology for Thin Films
9783527411672, 9783527664344
2012 215 English 3 Mb pdf GET
945661 Antonio Criminisi (auth.) Distinguished Dissertations
Accurate Visual Metrology from Single and Multiple Uncalibrated Images [1 ed.]
978-1-4471-1040-8, 978-0-85729-327-5
Springer-Verlag London 2001 184 English 8 Mb pdf GET
902409 I. Naydenova Advanced Holography - Metrology and Imaging
978-953-307-729-1
Intech 2011 388 English 48 Mb pdf GET
874099 Ciarlini P., et al. (eds.) Series on advances in mathematics for applied sciences, v. 53
Advanced Mathematical & Computational Tools in Metrology IV
9810242166, 9789810242169
World Scientific 2000 327 English 100 Mb pdf GET
1247014 P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert Series on Advances in Mathematics for Applied Sciences
Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences) [illustrated edition]
9789812566744, 9812566740
World Scientific Publishing Company 2006 384 English 5 Mb djvu GET
1350476 Pavese, Franco et al. (eds.) Series on advances in mathematics for applied sciences volume 86
Advanced mathematical and computational tools in metrology and testing X
9789814678612, 9814678619
World Scientific 2015 446 English 13 Mb pdf GET
874244 Franco Pavese; World Scientific (Firm); et al (eds.) Series on advances in mathematics for applied sciences, v. 78
Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
9789812839527, 9812839526, 1282442724, 9781282442726
World Scientific 2009 418 English 12 Mb pdf GET
263005 P. Ciarlini, M. G. Cox, E. Filipe, F. Pavese, D. Richter Series on Advances in Mathematics for Applied Sciences) (v. 5
Advanced Mathematical and Computational Tools in Metrology V
9789810244941, 9810244940
World Scientific Publishing Company 2001 384 English 7 Mb djvu GET
61722 P. Ciarlini, M. G. Cox, F. Pavese, G. B. Rossi Series on Advances in Mathematics for Applied Sciences
Advanced Mathematical and Computational Tools in Metrology VI
9789812389046, 981-238-904-0
World Scientific Publishing Company 2004 367 English 19 Mb pdf GET
502887 P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert Advanced Mathematical And Computational Tools in Metrology VII (Series on Advances in Mathematics for Applied Sciences)
9812566740, 9789812774187, 9789812566744
2006 384 English 16 Mb pdf GET
336740 P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert Series on Advances in Mathematics for Applied Sciences
Advanced Mathematical and Computational Tools in Metrology VII: 7 [illustrated edition]
9812566740, 9789812566744
World Scientific Pub Co ( 2006 384 English 18 Mb pdf GET
1282590 P. Ciarlini, M. G. Cox, F. Pavese, D. Richter Series on Advances in Mathematics for Applied Sciences
Advanced Mathematical Tools in Metrology III
0333612183, 9789810229184
World Scientific Pub Co Inc 1997 284 English 21 Mb pdf GET
244754 Franco Pavese, Alistair B.Forbes Advances in Data Modeling for Measurements in the Metrology and Testing Fields
978-0-8176-4592-2
Birkhauser 2004 496 English 6 Mb pdf GET
1154308 Guillermo H. Kaufmann (ed.) Advances in Speckle Metrology and Related Techniques [1st ed.]
3527409572, 9783527409570
Wiley-VCH 2011 327 English 5 Mb pdf GET
995575 Advances in Speckle Metrology and Related Techniques
9783527409570, 9783527633852
2011 322 English 5 Mb pdf GET
995764 Ammar Grous(auth.) Applied Metrology for Manufacturing Engineering
9781848211889, 9781118622551
Wiley-ISTE 2011 677 English 12 Mb pdf GET
356808 G. M. S. de Silva Basic Metrology for Iso 9000 Certification [1 ed.]
0750651652, 9780750651653, 9780585453859
Butterworth-Heinemann 2002 231 English 1 Mb pdf GET
607652 David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings) [1 ed.]
156396967X, 9781563969676
American Inst. of Physics 2001 205 English 6 Mb djvu GET
997187 Comprehensive Mass Metrology
9783527296149, 9783527602995
Wiley-VCH Verlag Berlin GmbH, Berlin 2000 557 English 15 Mb pdf GET
667637 Bala Muralikrishnan, Jay Raja (auth.) Computational Surface and Roundness Metrology [1 ed.]
9781848002975, 1848002963, 9781848002968
Springer-Verlag London 2009 263 English 4 Mb pdf GET
1469584 Jerzy A. Sładek (auth.) Springer Tracts in Mechanical Engineering
Coordinate Metrology : Accuracy of Systems and Measurements [1 ed.]
978-3-662-48463-0, 978-3-662-48465-4
Springer-Verlag Berlin Heidelberg 2016 VIII, 471 English 23 Mb pdf GET
736780 Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.) Modeling and Simulation in Science, Engineering and Technology
Data Modeling for Metrology and Testing in Measurement Science [1 ed.]
0817645926, 9780817645922
Birkhäuser Basel 2009 486 English 6 Mb pdf GET
166573 Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.) Modeling and simulation in science, engineering and technology
Data modeling for metrology and testing in measurement science [1 ed.]
0817645926, 9780817648046, 9780817645922, 0817648046
Birkhäuser Basel 2009 486 English 6 Mb pdf GET
943063 Franco Pavese (auth.), Franco Pavese, Alistair B. Forbes (eds.) Modeling and Simulation in Science, Engineering and Technology
Data Modeling for Metrology and Testing in Measurement Science [1 ed.]
978-0-8176-4592-2, 978-0-8176-4804-6
Birkhäuser Basel 2009 486 English 12 Mb pdf GET
764269 Anand Asundi Digital Holography for MEMS and Microsystem Metrology (Microsystem and Nanotechnology Series) [1 ed.]
0470978694, 9780470978696
Wiley 2011 222 English 4 Mb djvu GET
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 April McMahon, Robert McMahon
Eric Charpentier, Annick Lesne, Nikolaï K. Nikolski
Пуанкаре А. (H.Poincare)
Jean-Pierre Serre, J. Stilwell
Eberhard Freitag, Reinhardt Kiehl, Betty S. Waterhouse, William C. Waterhouse, J.A. Dieudonne
Gerstenhaber M., Schack S.
Adi Ben-Israel, Thomas N.E. Greville
Pavel I. Etingof
Langlands R.P.
Luigi A. Rosati
Маркушевич А.И.
Гахов Ф.Д.
A. Canada, P. Drabek, A. Fonda
Erich Zauderer
Frank Ayres, Elliott Mendelson
Jean Francois Colombeau
Rudin W.
Агранович М.С.
Антосик П., Микусинский Я., Сикорский Р. (Antosik P., Mikusinski J., Sikorski R.)
Никифоров А.Ф., Уваров В.Б.

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