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27 books found   ►also search"in circuit test" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
134026 Ralph Decker Bennett An Attempt to Test the Quantum Theory of X-Ray Scattering Circuit Cellar Incorporated 1925 2 English 211 kb pdf GET
651221 Parag K. Lala An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems)
1598293508
Morgan and Claypool Publishers 2008 111 English 8 Mb pdf GET
245548 Roberts, Gordon W Analog signal generation for built-in-self-test of mixed-signal integrated circuits
0-7923-9272-8
Academic Press 1995 93 English 18 Mb pdf GET
959946 Gordon W. Roberts, Albert K. Lu (auth.) The Springer International Series in Engineering and Computer Science 312
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits [1 ed.]
978-1-4613-5992-0, 978-1-4615-2341-3
Springer US 1995 122 English 3 Mb pdf GET
1378257 Perelroyzen, Evgeni Digital integrated circuits : design-for-test using Simulink and Stateflow
978-0-8493-3057-5, 0-8493-3057-2
CRC Press 2007 320 English 27 Mb pdf GET
1422994 Perelroyzen, Evgeni Digital integrated circuits : design-for-test using Simulink and Stateflow [1 ed.]
0-8493-3057-2, 978-0-8493-3057-5
CRC Press 2007 320 English 13 Mb pdf GET
673891 Louis Scheffer, Luciano Lavagno, Grant Martin EDA for IC System Design, Verification, and Testing (Electronic Design Automation for Integrated Circuits Hdbk)
0849379237, 9780849379239
CRC Press 2006 512 English 17 Mb pdf GET
864510 Louis Scheffer, Luciano Lavagno, Grant Martin EDA for IC System Design, Verification, and Testing (Electronic Design Automation for Integrated Circuits Hdbk) [First Edition]
0849379237, 9780849379239
CRC Press 2006 544 English 28 Mb pdf GET
267604 Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha Frontiers in Electronic Testing
Fault Diagnosis of Analog Integrated Circuits [1 ed.]
9780387257426, 038725742X
Springer 2005 183 English 6 Mb pdf GET
416186 Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing) [1 ed.]
038725742X, 9780387257433, 9780387257426
2005 183 English 6 Mb pdf GET
957436 Debashis Bhattacharya, John P. Hayes (auth.) The Kluwer International Series in Engineering and Computer Science 89
Hierarchical Modeling for VLSI Circuit Testing [1 ed.]
978-1-4612-8819-0, 978-1-4613-1527-8
Springer US 1990 160 English 5 Mb pdf GET
1111236 R. M. Marston (Auth.) Instrumentation and Test Gear Circuits Manual
978-0-7506-0758-2
Butterworth-Heinemann 1993 434 English 6 Mb pdf GET
1462576 Peter Shepherd (auth.) New Electronics Series
Integrated Circuit Design, Fabrication and Test
978-1-349-13656-8, 978-0-333-63039-6, 167-168-168-1
Macmillan Education UK 1996 English 22 Mb pdf GET
583238 Ian A. Grout Integrated Circuit Test Engineering: Modern Techniques [1st Edition.]
1846280230, 9781846280238
2005 362 English 3 Mb pdf GET
941902 Ian A. Grout PhD (auth.) Integrated Circuit Test Engineering: Modern Techniques [1 ed.]
978-1-84628-023-8, 978-1-84628-173-0
Springer-Verlag London 2006 362 English 3 Mb pdf GET
660828 Tom Larsen More Bench-Tested Circuits - Innovative Designs for Surveillance and Countersurveillance Technicians
9781581600070, 1581600070
Paladin Press 1998 71 English 5 Mb pdf GET
500432 Ai-Qun Liu (auth.) MEMS Reference Shelf 5
RF MEMS Switches and Integrated Switching Circuits: Design, Fabrication, and Test [1 ed.]
0387462619, 9780387462615
Springer US 2010 274 English 7 Mb pdf GET
941298 José L. Huertas (auth.), José L. Huertas (eds.) Test and Design-for-Testability in Mixed-Signal Integrated Circuits [1 ed.]
978-1-4419-5422-0, 978-0-387-23521-9
Springer US 2004 298 English 10 Mb pdf GET
1007072 Sun, Yichuang(eds.) Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits - The System on Chip Approach
978-1-61583-315-3, 978-0-86341-745-0
Institution of Engineering and Technology 2008 404 English 5 Mb pdf GET
254253 Y. Sun, Yichuang Sun Circuits, Devices and Systems
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
0863417450, 9780863417450
IET 2007 411 English 3 Mb pdf GET
342051 Niraj K. Jha, Sandip Kundu The Springer International Series in Engineering and Computer Science
Testing and Reliable Design of CMOS Circuits [1 ed.]
0792390563, 9780792390565
Springer 1989 242 English 1 Mb djvu GET
957480 Niraj K. Jha, Sandip Kundu (auth.) The Kluwer International Series in Engineering and Computer Science 88
Testing and Reliable Design of CMOS Circuits [1 ed.]
978-1-4612-8818-3, 978-1-4613-1525-4
Springer US 1990 232 English 6 Mb pdf GET
1205906 Sandeep K. Goel, Krishnendu Chakrabarty Devices, Circuits, & Systems
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits [1 ed.]
978-1-4398-2942-4, 978-1-4398-2941-7
CRC Press 2013 259 English 20 Mb pdf GET
1689542 Ran Wang and Krishnendu Chakrabarty Testing of Interposer-Based 2.5D Integrated Circuits Springer 2017 English 13 Mb pdf GET
940096 Josep Altet, Antonio Rubio (auth.) Thermal Testing of Integrated Circuits [1 ed.]
978-1-4419-5287-5, 978-1-4757-3635-9
Springer US 2002 204 English 7 Mb pdf GET
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