[PDF] engineering free ebooks download




View results: Search for a phrase:
ISBN Language MD5 Extension

Library Search


 Fiction Pdf Search   Sci-hubs

24154 books found   ►also search"engineering" in ,
ID Author(s) Title Publisher Year Pages Language Size Extension GET
133891 Kenneth B. Bischoff, Morton M. Denn, John H. Seinfeld, George Stephanopoulos, Arup Chakraborty, Arup Chakraborty, Nicholas Peppas, Jackie Ying, Jackie Ying, James Wei, James Wei Advances in Chemical Engineering 27
[1 ed.]
978-0-12-008527-9
Academic Press 2001 1-222 English 5 Mb rar GET
133892 James Wei, Morton M. Denn, John H. Seinfeld, Arup Chakraborty, Jackie Ying, Nicholas Peppas, George Stephanopoulos Advances in Chemical Engineering 28
[1 ed.]
978-0-12-008528-6
Academic Press 2001 1-493 English 16 Mb rar GET
134564 Chemical Engineering (Vol.137 No.3 March 2008)
2008 179 English 22 Mb rar GET
134567 Chemical Engineering Science 54
1999 5935 English 231 Mb rar GET
134568 Chemical Engineering Science 55
2000 6274 English 234 Mb rar GET
134569 Chemical Engineering Science. Vol. 52
1997 5363 English 299 Mb rar GET
134840 Computers and Chemical Engineering. Vol. 22
1998 3022 English 187 Mb rar GET
134841 Computers and Chemical Engineering. Vol. 23
1998 1889 English 38 Mb rar GET
134842 Computers and Chemical Engineering. Vol. 24
2000 2792 English 142 Mb rar GET
134843 Computers and Chemical Engineering. Vol. 25
2001 1716 English 41 Mb rar GET
134844 Computers and Chemical Engineering. Vol. 26
2002 1796 English 51 Mb rar GET
134845 Computers and Chemical Engineering. Vol. 27
2003 1948 English 57 Mb rar GET
424312 Thomas B. Drew, Giles R. Cokelet, John W. Hoopes and Theodore Vermeulen (Eds.) Advances in Chemical Engineering 11

978-0-12-008511-8
Elsevier, Academic Press 1981 ii-ix, 1-452 English 20 Mb pdf GET
457173 Thomas B. Drew and John W. Hoopes (Eds.) Advances in Chemical Engineering 1

978-0-12-008501-9
Elsevier, Academic Press 1956 iii-vii, 1-448 English 22 Mb pdf GET
464590 Thomas B. Drew, Giles R. Cokelet, John W. Hoopes and Theodore Vermeulen (Eds.) Advances in Chemical Engineering 8

978-0-12-008508-8
Elsevier, Academic Press 1970 ii-v, 1-386 English 10 Mb pdf GET
466144 Thomas B. Drew, John W. Hoopes and Theodore Vermeulen (Eds.) Advances in Chemical Engineering 3

978-0-12-008503-3
Elsevier, Academic Press 1962 iii-vii, 1-345 English 16 Mb pdf GET
470109 Thomas B. Drew, Giles R. Cokelet, John W. Hoopes and Theodore Vermeulen (Eds.) Advances in Chemical Engineering 7

978-0-12-008507-1
Elsevier, Academic Press 1968 ii-v, 1-413 English 19 Mb pdf GET
483342 Thomas B. Drew and John W. Hoopes (Eds.) Advances in Chemical Engineering 1

978-0-12-008501-9
Elsevier, Academic Press 1956 iii-vii, 1-448 English 14 Mb pdf GET
487384 James Wei (Eds.) Advances in Chemical Engineering 25
[1 ed.]
978-0-12-008525-5
Elsevier, Academic Press 1999 iii-ix, 1-290 English 14 Mb pdf GET
487385 James Wei, John L. Anderson, Kenneth B. Bischoff and John H. Seinfeld (Eds.) Advances in Chemical Engineering 17

978-0-12-008517-0
Elsevier, Academic Press 1991 iii-vii, 1-363 English 15 Mb pdf GET
508059 James Wei, John L. Anderson, Kenneth B. Bischoff and John H. Seinfeld (Eds.) Advances in Chemical Engineering 14

978-0-12-008514-9
Elsevier, Academic Press 1988 iii-vii, 1-326 English 14 Mb pdf GET
512915 James Wei, John L. Anderson, Kenneth B. Bischoff, Morton M. Denn and John H. Seinfeld (Eds.) Advances in Chemical Engineering 13

978-0-12-008513-2
Elsevier, Academic Press 1987 iii-viii, 1-274 English 10 Mb pdf GET
514646 James Wei (Eds.) Advances in Chemical Engineering 19

978-0-12-008519-4
Elsevier, Academic Press 1994 iii-vii, 1-425 English 20 Mb pdf GET
530411 Thomas B. Drew, Giles R. Cokelet, John W. Hoopes and Theodore Vermeulen (Eds.) Advances in Chemical Engineering 9

978-0-12-008509-5
Elsevier, Academic Press 1974 ii-x, 1-312 English 15 Mb pdf GET
532942 James Wei, Kenneth B. Bischoff, Thomas B. Drew and John H. Seinfeld (Eds.) Advances in Chemical Engineering 12

978-0-12-008512-5
Elsevier, Academic Press 1983 ii-ix, 1-309 English 8 Mb pdf GET
  ►

If no results, Please search engineering here Again

Random Recommend
 M. L. Martínez, N. P. Psuty, R. A. Lubke (auth.), Dr. M. Luisa Martínez, Dr. Norbert P. Psuty (eds.)
Akhlaq A. Farooqui, Wei-Yi Ong, Lloyd A. Horrocks (auth.)
Hitoshi Sakio (auth.), Hitoshi Sakio Ph.D., Toshikazu Tamura Ph.D. (eds.)
J. Alan Maschek, Bill J. Baker (auth.), Dr. Charles D. Amsler (eds.)
Angela A. Salim, Young-Won Chin (auth.), K.G. Ramawat, J.M. Merillon (eds.)
Janet Wright (auth.), John D. Peles, Janet Wright (eds.)
R.J. Pollitt (auth.), Nenad Blau, Marinius Duran, K. Michael Gibson (eds.)
George Ayoub (auth.), Joyce Tombran-Tink PhD, Colin J. Barnstable DPhil (eds.)
Patrick Meire, Marleen Coenen, Scientific Counsellor Claudio Lombardo, Michela Robba (auth.), Patrick Meire, Marleen Coenen, Scientific Counsellor Claudio Lombardo, Michela Robba, Roberto Sacile (eds.)
Gil Mor, Michele K. Montagna, Ayesha B. Alvero (auth.), Gil Mor, Ayesha B. Alvero (eds.)
Bing Yu (auth.), Ronald J.A. Trent (eds.)
Cheston B. Cunha, Burke A. Cunha (auth.), Professor Didier Raoult, Professor Michel Drancourt (eds.)
Y. Ru, B. -B. Wang, V. Brendel (auth.), Anireddy S. N. Reddy, Maxim Golovkin (eds.)
E. Mohammadi Goltapeh, Y. Rezaee Danesh, R. Prasad, A. Varma (auth.), Professor Dr. Ajit Varma (eds.)
Mark S. Butler, David J. Newman (auth.), Frank Petersen, René Amstutz (eds.)
J. Patrick Doody (auth.)
Emmanuel Donnadieu (auth.), Luis Graca (eds.)
Kensal E. van Holde (auth.), Martino Bolognesi, Guido di Prisco, Cinzia Verde (eds.)
Lars Håkanson, Andreas C. Bryhn (auth.)
Axel A. Brakhage, Julia Schuemann, Sebastian Bergmann (auth.), Frank Petersen, René Amstutz (eds.)
Soomin Park, John J. Harada (auth.), María F. Suárez, Peter V. Bozhkov (eds.)
Lars Olof Björn (auth.), Lars Olof Björn (eds.)
Christine R. Rozanas, Stacey M. Loyland (auth.), Brian C.-S. Liu, Joshua R. Ehrlich (eds.)
Vasilis D. Valavanis (auth.), Vasilis D. Valavanis (eds.)
Nicole Urban, Charles Drescher (auth.), George Coukos, Andrew Berchuck, Robert Ozols (eds.)
Joseph A. Chapman, John E. C. Flux (auth.), Professor Dr. Paulo C. Alves, Professor Dr. Nuno Ferrand, Professor Dr. Klaus Hackländer (eds.)
Lionel Navarro, Rajendra Bari, Alexandre Seilaniantz, Adnane Nemri (auth.), J.P. Gustafson, J. Taylor, G. Stacey (eds.)
Peter J. Lewis (auth.), Walid El-Sharoud (eds.)
F. Bravo, R. Jandl, K. V. Gadow, V. LeMay (auth.), Dr. Felipe Bravo, Dr. Robert Jandl, Dr. Valerie LeMay, Prof. Klaus von Gadow (eds.)
Gottfried von Keudell, Kerstin Cornils, Anita Badbaran, Claudia Lange, Dr. Boris Fehse (auth.), Dr. Nadja M. Bilko, Dr. Boris Fehse, Dr. Wolfram Ostertag, Dr. Carol Stocking, Dr. Axel R. Zander (eds.)
Derek Gilroy, Toby Lawrence (auth.), Dr Adriano G. Rossi, Dr Deborah A. Sawatzky (eds.)
T. H. N. Ellis (auth.), Felix D. Dakora, Samson B. M. Chimphango, Alex J. Valentine, Claudine Elmerich, William E. Newton (eds.)
Christiana Ruhrberg PhD (auth.)
Wendy Jepson, Andrew Millington (eds.)
Karl A. Western (auth.), Vassil St. Georgiev PhD, Karl A. Western MD, John J. McGowan PhD (eds.)
Guijian Liu, Zhiyuan Niu, Daniel Van Niekerk (auth.), Dr. David M. Whitacre (eds.)
Peter Palukaitis, John P. Carr, James E. Schoelz (auth.), Gary D. Foster, I. Elisabeth Johansen, Yiguo Hong, Peter D. Nagy (eds.)
Barbara M. Reed (auth.), Barbara M. Reed (eds.)
Mika Tarkka, Silvia Schrey, Rüdiger Hampp (auth.), Professor Dr. Chandra Shekhar Nautiyal, Professor Dr. Patrice Dion (eds.)
Léon Otten, Thomas Burr, Ernö Szegedi (auth.), Tzvi Tzfira, Vitaly Citovsky (eds.)
Arthur A. Hurwitz, Dmitry I. Gabrilovich (auth.), Dmitry I. Gabrilovich, Arthur A. Hurwitz (eds.)
Arun K. Bhunia (auth.)
Henrique D. Vieira (auth.), Ricardo M. Souza (eds.)
Murat Emre (auth.), Abraham Fisher, Maurizio Memo, Fabrizio Stocchi, Israel Hanin (eds.)
Judy D. Wall, Adam P. Arkin, Nurgul C. Balci (auth.), Dr. Christiane Dahl, Dr. Cornelius G. Friedrich (eds.)
Andrew Dillin, Jan Karlseder (auth.), Dr. K. Lenhard Rudolph (eds.)
A. G. (Tony) Fane, Rong Wang, Yue Jia (auth.), Lawrence K. Wang, Jiaping Paul Chen, Yung-Tse Hung, Nazih K. Shammas (eds.)
Roland Frey, Alban Gebler, Kirk A. Olson, Daria Odonkhuu (auth.), Hideki Endo Ph.D., Roland Frey Ph.D. (eds.)
Sonia B. Jakowlew PhD (auth.)
Andrii Rozhok (auth.)
 Roland Lazenby
Minako O'Hagan
Dan Ramsey
Franco, Verrier (Authors)
Mike Blakely
Wallace O. Charition
Joan Zieger
Christina Bratt Paulston
Learning Express Editors
James P. Lewis
David Roberts
Frank W. Hoffmann, Richard J. Wood
Daniel D. Chiras
Learning Express Editors
Michelle McCarthy
Jack Canfield, Mark Victor Hansen, Heather McNamara
Learning Express Editors
Evgenii Bronislavovich Pashukanis
Horace Edward Henderson
Kristin Hannah
Larissa T. Moss, Shaku Atre
Brigitte Goede
Richard Brightfield
Leah Cypess
Robin Williams
Margaret O'Leary
Dow Jones Publishing Company (Asia)
John C. Dixon
Dow Jones Publishing Company (Asia)
David Hewson
John P Wolf, Andrew J. Deeks
Dow Jones Publishing Company (Asia)
Cyn Balog
Dow Jones Publishing Company (Asia)
Adolfo Bioy Casares
J. Spencer Trimingham
Kevin Brockmeier
Harry F. Baker, Rosalind M. Ridley
David Muñoz Rodríguez, Frantz Bouchereau Lara, César Vargas Rosales, Rogerio Enríquez-Caldera
H. Russell Bernard
William Maginn
Stanley Mordaunt Leathes
Aleksander Cyunczyk
Alberto Canto García
Ηρόδοτος, Γαβριήλ Συντομόρος (μετάφραση)
Erika Dillman
Adolf bernhard Marx
Florence Ada Keynes
Honor Matthews
Sarah Mytton Maury

reed solomon codepush pullhydrological modellingreaction mechanismbiomedical researchcase hardeningprobability theoryasymptoticsrigid body dynamicsbiochemistrymental healthedsdurationoccupational safetygraphical user interfacesparameter estimationnitric oxidesampling methodspublishingtransmission lineparallel processingoptoelectronicsinjury preventionmagnetic propertiestestingmagnetic propertiesglycogen synthase kinase 3humanidadesminimum inhibitory concentrationforest managementhigh dimensional datagas chromatographdark matter halocastingfood preservativesswitchesmicroorganismmagnetic fieldexpert systemcritical thinkingdoubled haploidoccupational safetysuicide preventionreproductioncontrol systemspolarized lightcrystal structurephotogrammetry